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Probe Station

Introduction

High-precision probe system that enables testing at multiple temperatures. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C.

Characteristics

Device Name	Probe Station
Model	Cascade Summit11K
Characteristics	-Re-configurable for DC, RF, mmW, FA, WLR and more -Thermal range: -60˚C to 300˚C available -Upgrade path to meet your future needs -Stable and repeatable measurements over a wide thermal range -Advanced shielding solution -Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology -Advanced EMI-shielding with PureLine with AttoGuard technologies -Best solution for low-noise and 1/f measurements -Minimize AC and spectral noise -Intuitive ergonomic stage controls -Quick, safe, and comfortable wafer access -Easy on-wafer navigation

Device Name

Probe Station

Model

Cascade Summit11K

Characteristics

-Re-configurable for DC, RF, mmW, FA, WLR and more

-Thermal range: -60˚C to 300˚C available

-Upgrade path to meet your future needs

-Stable and repeatable measurements over a wide thermal range

-Advanced shielding solution

-Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology

-Advanced EMI-shielding with PureLine with AttoGuard technologies

-Best solution for low-noise and 1/f measurements

-Minimize AC and spectral noise

-Intuitive ergonomic stage controls

-Quick, safe, and comfortable wafer access

-Easy on-wafer navigation